Measuring Area-Complexity Using Boolean Difference

For a combinational circuit, area-complexity is a measure that estimates the logic area of the circuit without mapping to logic gates. Several measures like literal count, number of primary input/outputs, etc. have been used in the past as area-complexity metrics. In this paper, we propose a novel a...

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Veröffentlicht in:2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems S. 245 - 250
Hauptverfasser: Kagliwal, A., Balachandran, S.
Format: Tagungsbericht Journal Article
Sprache:Englisch
Veröffentlicht: IEEE 01.01.2013
Schlagworte:
Area measurement
area-complexity
Benchmark testing
Boolean algebra
Boolean difference
Boolean functions
Circuits
Complexity theory
Conferences
Design engineering
Integrated circuits
Logic
Logic gates
logic synthesis
Taylor series
Very large scale integration
ISBN:146734639X, 9781467346399
ISSN:1063-9667
Online-Zugang:Volltext
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Abstract For a combinational circuit, area-complexity is a measure that estimates the logic area of the circuit without mapping to logic gates. Several measures like literal count, number of primary input/outputs, etc. have been used in the past as area-complexity metrics. In this paper, we propose a novel area-complexity measure using the theory of Boolean difference and Taylor expansion for Boolean functions. We demonstrate how to capture the area-complexity of a Boolean function using the complexity of its Boolean derivatives. We evaluate the metric on circuits from MCNC benchmark suite and a sizeable collection of randomly generated circuits. We compare our metric with existing techniques based on literal-count and BDD properties. We show that the new area-complexity measure is accurate within 10% of the actual number of gates synthesized using ABC as opposed to at least 100% and 15% for the metrics based on literal-count and BDD properties respectively. We also show the robustness of our metric across three different gate-libraries.
AbstractList For a combinational circuit, area-complexity is a measure that estimates the logic area of the circuit without mapping to logic gates. Several measures like literal count, number of primary input/outputs, etc. have been used in the past as area-complexity metrics. In this paper, we propose a novel area-complexity measure using the theory of Boolean difference and Taylor expansion for Boolean functions. We demonstrate how to capture the area-complexity of a Boolean function using the complexity of its Boolean derivatives. We evaluate the metric on circuits from MCNC benchmark suite and a sizeable collection of randomly generated circuits. We compare our metric with existing techniques based on literal-count and BDD properties. We show that the new area-complexity measure is accurate within 10% of the actual number of gates synthesized using ABC as opposed to at least 100% and 15% for the metrics based on literal-count and BDD properties respectively. We also show the robustness of our metric across three different gate-libraries.
Author Balachandran, S.
Kagliwal, A.
Author_xml – sequence: 1
  givenname: A.
  surname: Kagliwal
  fullname: Kagliwal, A.
  email: kagliwal@cse.iitm.ac.in
  organization: Comput. Sci. & Eng. Dept., Indian Inst. of Technol. Madras, Chennai, India
– sequence: 2
  givenname: S.
  surname: Balachandran
  fullname: Balachandran, S.
  email: shankar@cse.iitm.ac.in
  organization: Comput. Sci. & Eng. Dept., Indian Inst. of Technol. Madras, Chennai, India
BookMark eNotjDtPAkEURseIiYC0NjaUNov3zuy8SgQfJBgLxdhtZoc7ZsyyiztLAv9eDBZfTnJy8g1Yr25qYuwaYYII9u5j-baYTzigmKCVZ2xktQGtrMyNsXDOBpgrLXIl7GeP9RGUyKxS-pINUvoGACNB9xl_IZd2bay_xtOWXDZrNtuK9rE7jFfpz943TUWuHs9jCNRS7emKXQRXJRr9c8hWjw_vs-ds-fq0mE2XWeRgumxdcuS5pWDRaXJOem-5197i2iopOGgJgFJgKEunAL0NyskQSuelL3kQQ3Z7-t22zc-OUldsYvJUVa6mZpcK1EZxNFLCMb05pZGIim0bN649FCrX_DjxC3b7Vho
CODEN IEEPAD
ContentType Conference Proceeding
Journal Article
DBID 6IE
6IL
CBEJK
RIE
RIL
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
DOI 10.1109/VLSID.2013.195
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Xplore POP ALL
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Technology Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
DatabaseTitle Technology Research Database
Computer and Information Systems Abstracts – Academic
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts Professional
DatabaseTitleList
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 9780769548890
076954889X
EndPage 250
ExternalDocumentID 6472647
Genre orig-research
GroupedDBID 23M
29R
6IE
6IF
6IH
6IK
6IL
6IN
AAJGR
AAWTH
ABLEC
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IPLJI
M43
OCL
RIE
RIL
RNS
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
ID FETCH-LOGICAL-i208t-db21249ef91a7eaa5cc92c7c91d96532075001531fbba601c9f6a5ffbac5cb2f3
IEDL.DBID RIE
ISBN 146734639X
9781467346399
ISICitedReferencesCount 1
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000320778900066&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 1063-9667
IngestDate Fri Jul 11 08:15:01 EDT 2025
Wed Aug 27 03:11:28 EDT 2025
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i208t-db21249ef91a7eaa5cc92c7c91d96532075001531fbba601c9f6a5ffbac5cb2f3
Notes ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Conference-1
ObjectType-Feature-3
content type line 23
SourceType-Conference Papers & Proceedings-2
PQID 1786218550
PQPubID 23500
PageCount 6
ParticipantIDs ieee_primary_6472647
proquest_miscellaneous_1786218550
PublicationCentury 2000
PublicationDate 2013-Jan.
20130101
PublicationDateYYYYMMDD 2013-01-01
PublicationDate_xml – month: 01
  year: 2013
  text: 2013-Jan.
PublicationDecade 2010
PublicationTitle 2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems
PublicationTitleAbbrev ICVD
PublicationYear 2013
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0008507
ssj0001035131
Score 1.9078844
Snippet For a combinational circuit, area-complexity is a measure that estimates the logic area of the circuit without mapping to logic gates. Several measures like...
SourceID proquest
ieee
SourceType Aggregation Database
Publisher
StartPage 245
SubjectTerms Area measurement
area-complexity
Benchmark testing
Boolean algebra
Boolean difference
Boolean functions
Circuits
Complexity theory
Conferences
Design engineering
Integrated circuits
Logic
Logic gates
logic synthesis
Taylor series
Very large scale integration
Title Measuring Area-Complexity Using Boolean Difference
URI https://ieeexplore.ieee.org/document/6472647
https://www.proquest.com/docview/1786218550
WOSCitedRecordID wos000320778900066&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1JS8NAGP1oiwe9uLRi3Yjg0bSZLLMc1VoUaim40FuYFQqSSJsK_ntnprEV9OIhMDkEZobJfOt7D-Ay1TwyWPsfCYepYCjklOsw4ylGXCpKMw8UHpHxmE6nbNKAqzUWRmvtm890zw19LV-VculSZX1HdW6fJjQJwSus1iaf4kpiyaa9g2YeKm0jnsQxUBIP6sIkSa1Jnn5zPdXvrGZzRBHrv46eHgau5SvpISc64TVXfl3U3voMd_837z3obGB8wWRtoPahoYsD2PnBQNiG-NHnCO04uLbuY-iuB0eRWX0GvpkguCnLN82LYFALqUjdgZfh3fPtfVjLKISzOKJVqETsFKa1YYgTzXkmJYslkQwphp0uhHUarFOQICMEt_GZZAbzzBjBZSZFbJJDaBVloY8giJVCSGCqY45TZjhNORWRUowakklMu9B2q8_fV0wZeb3wLlx8b19uT68rSfBCl8tFjoiNqJAjVTv--9MT2I69AIVLepxCq5ov9RlsyY9qtpif-yPwBS1HqwA
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1NS8MwGH6ZU1Avfmzi_Kzg0W5N2qbJUZ1jw20MnLJbSdMEBtLK1gn-e5Os2wS9eCikh0IS0ryfz_MA3AaSe4pI-yMRN0gYcjnl0g15QBAXKaWhBQr3o-GQTiZsVIG7NRZGSmmbz2TTDG0tP83FwqTKWobqXD9bsB0GAfaWaK1NRsUUxfxNgwcNLVhaxzy-4aCMLKyLRH6gjfJkxfZUvrOSzxF5rPXWf-m1TdOX30RGdsKqrvy6qq396Rz8b-aHUN8A-ZzR2kQdQUVmx7D_g4OwBnhgs4R67NxrB9I1F4QhySy-HNtO4Dzk-bvkmdMupVSErMNr52n82HVLIQV3ij1auGmCjca0VAzxSHIeCsGwiARDKSNGGUK7Ddot8JFKEq4jNMEU4aFSCRehSLDyT6Ca5Zk8BQenKUIJoRJzEjDFacBp4qUpoyoKBaENqJnVxx9Lroy4XHgDblbbF-vza4oSPJP5Yh6jSMdUyNCqnf396TXsdseDftzvDZ_PYQ9bOQqTArmAajFbyEvYEZ_FdD67ssfhG0fTrkc
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2013+26th+International+Conference+on+VLSI+Design+and+2013+12th+International+Conference+on+Embedded+Systems&rft.atitle=Measuring+Area-Complexity+Using+Boolean+Difference&rft.au=Kagliwal%2C+A.&rft.au=Balachandran%2C+S.&rft.date=2013-01-01&rft.pub=IEEE&rft.isbn=9781467346399&rft.issn=1063-9667&rft.spage=245&rft.epage=250&rft_id=info:doi/10.1109%2FVLSID.2013.195&rft.externalDocID=6472647
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1063-9667&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1063-9667&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1063-9667&client=summon