Measuring Area-Complexity Using Boolean Difference

For a combinational circuit, area-complexity is a measure that estimates the logic area of the circuit without mapping to logic gates. Several measures like literal count, number of primary input/outputs, etc. have been used in the past as area-complexity metrics. In this paper, we propose a novel a...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems s. 245 - 250
Hlavní autoři: Kagliwal, A., Balachandran, S.
Médium: Konferenční příspěvek Journal Article
Jazyk:angličtina
Vydáno: IEEE 01.01.2013
Témata:
Area measurement
area-complexity
Benchmark testing
Boolean algebra
Boolean difference
Boolean functions
Circuits
Complexity theory
Conferences
Design engineering
Integrated circuits
Logic
Logic gates
logic synthesis
Taylor series
Very large scale integration
ISBN:146734639X, 9781467346399
ISSN:1063-9667
On-line přístup:Získat plný text
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
Popis
Shrnutí:For a combinational circuit, area-complexity is a measure that estimates the logic area of the circuit without mapping to logic gates. Several measures like literal count, number of primary input/outputs, etc. have been used in the past as area-complexity metrics. In this paper, we propose a novel area-complexity measure using the theory of Boolean difference and Taylor expansion for Boolean functions. We demonstrate how to capture the area-complexity of a Boolean function using the complexity of its Boolean derivatives. We evaluate the metric on circuits from MCNC benchmark suite and a sizeable collection of randomly generated circuits. We compare our metric with existing techniques based on literal-count and BDD properties. We show that the new area-complexity measure is accurate within 10% of the actual number of gates synthesized using ABC as opposed to at least 100% and 15% for the metrics based on literal-count and BDD properties respectively. We also show the robustness of our metric across three different gate-libraries.
Bibliografie:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Conference-1
ObjectType-Feature-3
content type line 23
SourceType-Conference Papers & Proceedings-2
ISBN:146734639X
9781467346399
ISSN:1063-9667
DOI:10.1109/VLSID.2013.195