Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications"

Presents corrections to the paper, (Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications").

Bibliographic Details

Published in:	IEEE transactions on instrumentation and measurement Vol. 74; p. 1
Main Authors:	Kang, Junho, Han, Woosol, Kim, Suhwan, Jun, Jaehoon
Format:	Journal Article
Language:	English
Published:	New York IEEE 2025 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:	Performance evaluation
ISSN:	0018-9456, 1557-9662
Online Access:	Get full text
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