Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications"
Presents corrections to the paper, (Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications").
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| Published in: | IEEE transactions on instrumentation and measurement Vol. 74; p. 1 |
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| Main Authors: | , , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
New York
IEEE
2025
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subjects: | |
| ISSN: | 0018-9456, 1557-9662 |
| Online Access: | Get full text |
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| Summary: | Presents corrections to the paper, (Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications"). |
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| Bibliography: | ObjectType-Correction/Retraction-1 SourceType-Scholarly Journals-1 content type line 14 |
| ISSN: | 0018-9456 1557-9662 |
| DOI: | 10.1109/TIM.2025.3561610 |