Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe

In this paper, we introduce a low-cost, expansible, and compatible measurement and control system for atomic force microscopes (AFM) based on a quartz tuning fork (QTF) self-sensing probe and frequency modulation, which is mainly composed of an embedded control system and a probe system. The embedde...

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Bibliographic Details
Published in:	Micromachines (Basel) Vol. 14; no. 1; p. 227
Main Authors:	Luo, Yongzhen, Ding, Xidong, Chen, Tianci, Su, Tao, Chen, Dihu
Format:	Journal Article
Language:	English
Published:	Switzerland MDPI AG 15.01.2023 MDPI
Subjects:	Analog to digital converters atomic force microscope Atomic force microscopes Automatic control Automatic gain control Channels Circuit design Computer peripherals Computers Control systems Digital signal processing Digital signal processors Digital to analog converters embedded control Embedded systems Error analysis Field programmable gate arrays Frequency measurement Frequency modulation Frequency synthesizers Image quality Lock in amplifiers measurement and control system Microprocessors Microscopes Microscopy Q factors Quartz quartz tuning fork Self excitation self-inductive probe Sensors Software Topography Tungsten Tuning atomic force microscope self-inductive probe embedded control frequency modulation measurement and control system quartz tuning fork
ISSN:	2072-666X, 2072-666X
Online Access:	Get full text
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