Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe

In this paper, we introduce a low-cost, expansible, and compatible measurement and control system for atomic force microscopes (AFM) based on a quartz tuning fork (QTF) self-sensing probe and frequency modulation, which is mainly composed of an embedded control system and a probe system. The embedde...

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Vydáno v:	Micromachines (Basel) Ročník 14; číslo 1; s. 227
Hlavní autoři:	Luo, Yongzhen, Ding, Xidong, Chen, Tianci, Su, Tao, Chen, Dihu
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	Switzerland MDPI AG 15.01.2023 MDPI
Témata:	Analog to digital converters atomic force microscope Atomic force microscopes Automatic control Automatic gain control Channels Circuit design Computer peripherals Computers Control systems Digital signal processing Digital signal processors Digital to analog converters embedded control Embedded systems Error analysis Field programmable gate arrays Frequency measurement Frequency modulation Frequency synthesizers Image quality Lock in amplifiers measurement and control system Microprocessors Microscopes Microscopy Q factors Quartz quartz tuning fork Self excitation self-inductive probe Sensors Software Topography Tungsten Tuning atomic force microscope self-inductive probe embedded control frequency modulation measurement and control system quartz tuning fork
ISSN:	2072-666X, 2072-666X
On-line přístup:	Získat plný text
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