CMOS-Based High-Density Silicon Microprobe Arrays for Electronic Depth Control in Intracortical Neural Recording-Characterization and Application

This paper reports on the characterization and intracortical recording performance of high-density complementary-metal-oxide-semiconductor (CMOS)-based silicon microprobe arrays. They comprise multiplexing units integrated on the probe shafts being part of the signal transmission path. Their electri...

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Veröffentlicht in:Journal of microelectromechanical systems Jg. 21; H. 6; S. 1426 - 1435
Hauptverfasser: Seidl, K., Schwaerzle, M., Ulbert, I., Neves, H. P., Paul, O., Ruther, P.
Format: Journal Article
Sprache:Englisch
Veröffentlicht: New York, NY IEEE 01.12.2012
Institute of Electrical and Electronics Engineers
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ISSN:1057-7157, 1941-0158
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Abstract This paper reports on the characterization and intracortical recording performance of high-density complementary-metal-oxide-semiconductor (CMOS)-based silicon microprobe arrays. They comprise multiplexing units integrated on the probe shafts being part of the signal transmission path. Their electrical characterization reveals a negligible contribution on the electrode impedances of 139 ±11 kΩ and 1.2 ±0.1 MΩ and on the crosstalks of 0.12% and 0.98% for iridium oxide ( IrO x ) and platinum (Pt) electrodes, respectively. The power consumption of the single-shaft probe was found to be 57.5 μW during electrode selection. The noise voltage of the switches was determined to be 5.6 nV/√Hz; it does not measurably affect the probe performance. The recording selectivity of the electrode array is demonstrated by electrical potential measurements in saline solution while injecting a stimulating current using an external probe. In-vivo recordings in anesthetized rats using all 188 electrodes with a pitch of 40.7 μm are presented and analyzed in terms of single neural activity and signal-to-noise ratio. The concept of electronic depth control is proven by performing mechanical translation of the probe shaft while electronically switching to adjacent electrodes to compensate the mechanical shift.
AbstractList This paper reports on the characterization and intracortical recording performance of high-density complementary-metal-oxide-semiconductor (CMOS)-based silicon microprobe arrays. They comprise multiplexing units integrated on the probe shafts being part of the signal transmission path. Their electrical characterization reveals a negligible contribution on the electrode impedances of 139 ±11 kΩ and 1.2 ±0.1 MΩ and on the crosstalks of 0.12% and 0.98% for iridium oxide ( IrO x ) and platinum (Pt) electrodes, respectively. The power consumption of the single-shaft probe was found to be 57.5 μW during electrode selection. The noise voltage of the switches was determined to be 5.6 nV/√Hz; it does not measurably affect the probe performance. The recording selectivity of the electrode array is demonstrated by electrical potential measurements in saline solution while injecting a stimulating current using an external probe. In-vivo recordings in anesthetized rats using all 188 electrodes with a pitch of 40.7 μm are presented and analyzed in terms of single neural activity and signal-to-noise ratio. The concept of electronic depth control is proven by performing mechanical translation of the probe shaft while electronically switching to adjacent electrodes to compensate the mechanical shift.
Author Neves, H. P.
Ulbert, I.
Paul, O.
Seidl, K.
Schwaerzle, M.
Ruther, P.
Author_xml – sequence: 1
  givenname: K.
  surname: Seidl
  fullname: Seidl, K.
  email: karsten@seidl.eu
  organization: Dept. of Microsyst. Eng. (IMTEK), Univ. of Freiburg, Freiburg, Germany
– sequence: 2
  givenname: M.
  surname: Schwaerzle
  fullname: Schwaerzle, M.
  email: michael.schwaerzle@imtek.de
  organization: Dept. of Microsyst. Eng. (IMTEK), Univ. of Freiburg, Freiburg, Germany
– sequence: 3
  givenname: I.
  surname: Ulbert
  fullname: Ulbert, I.
  email: ulbert@cogpsyphy.hu
  organization: Inst. for Psychol., Budapest, Hungary
– sequence: 4
  givenname: H. P.
  surname: Neves
  fullname: Neves, H. P.
  email: herc@imec.be
  organization: Imec, Leuven, Belgium
– sequence: 5
  givenname: O.
  surname: Paul
  fullname: Paul, O.
  email: paul@imtek.de
  organization: Dept. of Microsyst. Eng. (IMTEK), Univ. of Freiburg, Freiburg, Germany
– sequence: 6
  givenname: P.
  surname: Ruther
  fullname: Ruther, P.
  email: ruther@imtek.de
  organization: Dept. of Microsyst. Eng. (IMTEK), Univ. of Freiburg, Freiburg, Germany
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=26711430$$DView record in Pascal Francis
BookMark eNp9UT1PwzAQtVCRaAt_ABYvjCm2k9jOWEKhRQ2VKMyRazutUXAiOwzlX_CPcT9gYGB6d757d8_3BqBnG6sBuMRohDHKbh6LSbEcEYTJiBBEU5qcgD7OEhwhnPJeiFHKIoZTdgYG3r8hhJOE0z74yovFMroVXis4NetNdKetN90WLk1tZGNhYaRrWtesNBw7J7YeVo2Dk1rLzjXWSHin224D88aGvIbGwlmIhGxcZ6So4ZP-cAGedXhRxq6jfCNCudPOfIrOhA3CKjhu27Bun5-D00rUXl8ccQhe7ycv-TSaLx5m-XgeSZKxLpKcxxVNUSyVYIhxQVkWkJJUxphoilYKJVwyIgkWK0UUl0jGTCWYxJqrLB6C68PcVvggtHLCSuPL1pl34bYloQzjJEahjx_6wh28d7oqpen2SsM3TV1iVO4sKPcWlDsLyqMFgUr-UH-m_0u6OpCM1vqXQEmSsSD9G0DAlg0
CODEN JMIYET
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ContentType Journal Article
Copyright 2014 INIST-CNRS
Copyright_xml – notice: 2014 INIST-CNRS
DBID 97E
RIA
RIE
AAYXX
CITATION
IQODW
DOI 10.1109/JMEMS.2012.2206564
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE/IET Electronic Library
CrossRef
Pascal-Francis
DatabaseTitle CrossRef
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE/IET Electronic Library
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
Applied Sciences
EISSN 1941-0158
EndPage 1435
ExternalDocumentID 26711430
10_1109_JMEMS_2012_2206564
6249712
Genre orig-research
GroupedDBID -~X
.DC
0R~
29L
4.4
5GY
5VS
6IK
97E
9M8
AAIKC
AAJGR
AAMNW
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACBEA
ACGFS
ACIWK
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
ICLAB
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
RXW
TAE
TN5
TWZ
VH1
XWC
AAYXX
CITATION
IQODW
RIG
ID FETCH-LOGICAL-c297t-c883f6503cda7078a679707625c312e60bd048c72c21abd2d8c0c37d4123e8d93
IEDL.DBID RIE
ISICitedReferencesCount 42
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000311854500022&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 1057-7157
IngestDate Mon Jul 21 09:13:33 EDT 2025
Tue Nov 18 20:55:37 EST 2025
Sat Nov 29 03:00:43 EST 2025
Tue Aug 26 16:58:26 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 6
Keywords Microprobe
Multiplexing
Energy consumption
Crosstalk
Central nervous system
Data transmission
electrode selection
Shafts
Platinum
Complementary MOS technology
Complementary-metal-oxide-semiconductor (CMOS) circuitry
noise
Silicon
Microsensors
Microelectromechanical device
Microelectrodes
potential measurements
Signal-to-noise ratio
CMOS MEMS
high-density electrode array
In vivo
Electrical measurement
neural recording
silicon microprobes
electrode impedances
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
CC BY 4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c297t-c883f6503cda7078a679707625c312e60bd048c72c21abd2d8c0c37d4123e8d93
PageCount 10
ParticipantIDs crossref_citationtrail_10_1109_JMEMS_2012_2206564
pascalfrancis_primary_26711430
crossref_primary_10_1109_JMEMS_2012_2206564
ieee_primary_6249712
PublicationCentury 2000
PublicationDate 2012-12-01
PublicationDateYYYYMMDD 2012-12-01
PublicationDate_xml – month: 12
  year: 2012
  text: 2012-12-01
  day: 01
PublicationDecade 2010
PublicationPlace New York, NY
PublicationPlace_xml – name: New York, NY
PublicationTitle Journal of microelectromechanical systems
PublicationTitleAbbrev JMEMS
PublicationYear 2012
Publisher IEEE
Institute of Electrical and Electronics Engineers
Publisher_xml – name: IEEE
– name: Institute of Electrical and Electronics Engineers
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SSID ssj0014486
Score 2.2574904
Snippet This paper reports on the characterization and intracortical recording performance of high-density complementary-metal-oxide-semiconductor (CMOS)-based silicon...
SourceID pascalfrancis
crossref
ieee
SourceType Index Database
Enrichment Source
Publisher
StartPage 1426
SubjectTerms Applied sciences
CMOS integrated circuits
CMOS MEMS
Complementary-metal-oxide-semiconductor (CMOS) circuitry
Crosstalk
electrode impedances
electrode selection
Electrodes
Electronics
Exact sciences and technology
high-density electrode array
Impedance
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Mechanical instruments, equipment and techniques
Micro- and nanoelectromechanical devices (mems/nems)
Micromechanical devices and systems
neural recording
Neurons
noise
Physics
potential measurements
Probes
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Shafts
silicon microprobes
Title CMOS-Based High-Density Silicon Microprobe Arrays for Electronic Depth Control in Intracortical Neural Recording-Characterization and Application
URI https://ieeexplore.ieee.org/document/6249712
Volume 21
WOSCitedRecordID wos000311854500022&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE/IET Electronic Library
  customDbUrl:
  eissn: 1941-0158
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0014486
  issn: 1057-7157
  databaseCode: RIE
  dateStart: 19920101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3fS9xAEB5ULOhDbbWl16rsg291Ndm9y24e7XlShbOFs-Bb2F_BgyPKXRT8M_yPndnEqCAFnzaQ3U3It2Tm2_1mBmAvKz2yZGQntL_G-1amXOdmgICUqbd2oKSwsdiEOj_Xl5f53yXY72JhQghRfBYO6DKe5ftrd0tbZYcZcgVFJYWXlVJNrFZ3YoA0I0YSof_BVTpQTwEySX54Nh6NJ6TiEgdCoMnN-q-MUKyqQppIs8DPUjb1LF4YmZON973eJ_jYOpPsqEH_MyyFahPWX6QY3IQPUeLpFlvwMBz_mfBfaLU8I3UHPybten3PJtMZLoeKjUmbRwVmAs44N_cLhg4tG3V1cthxuKmv2LARt7NpxU5pZxjpa9wPZ5TnA5uG0OLD-bBLBt3EejJTeXb0fGL-Bf6djC6Gv3lbkIE7kauaO61liS6ddN5QliCTqRxbpFBOpiJkifX4Q3BKOJEa64XXLnFS-T6ax6B9Lr_CSnVdhW_ApFciCblNjfH9Mim11ehcGqGtTcqQqh6kTwgVrs1WTkUzZkVkLUleRFQLQrVoUe3Bz27MTZOr47-9twjCrmeLXg92Xy2E7r7IFHJHmXx_e9wPWKPZG6XLNqzU89uwA6vurp4u5rtxrT4CzBjnoQ
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1NT9wwEB0h2opyaClQdfsBPvQGhtjOxs6RLougJQvSgsQt8lfUlVBAuwGJn9F_3LETUpCqSj05Uuw4yrMy8-w3MwBfs8ohS0Z2EvbXaGoEoyrXQwSkYs6YoRTcxGITcjJRV1f5-RLs9rEw3vsoPvN74TKe5bsbexe2yvYz5AoylBR-MUxTztporf7MAIlGjCVCD4RKNpSPITJJvv-9GBfToOPie5yj0c3SZ2Yo1lUJqki9wA9TtRUtnpiZo7f_94Jr8KZzJ8lBi_87WPL1Oqw-STK4Dq-iyNMuNuDXqDib0m9otxwJ-g56GNTrzQOZzq5xQdSkCOq8UGLG4xPn-mFB0KUl475SDjn0t81PMmrl7WRWk5OwN4wENu6Ik5DpA5uW0uLkdNSng26jPYmuHTn4c2a-CZdH44vRMe1KMlDLc9lQq5So0KkT1umQJ0hnMscWSZQVjPssMQ5_CVZyy5k2jjtlEyukS9FAeuVy8R6W65vafwAinOSJzw3T2qVVUimj0L3UXBmTVJ7JAbBHhErb5SsPZTOuy8hbkryMqJYB1bJDdQA7_ZjbNlvHP3tvBAj7nh16A9h6thD6-zyTyB5F8vHv47Zh5fiiOC1PTyY_PsHrMFOre_kMy838zn-Bl_a-mS3mW3Hd_gb6duro
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=CMOS-Based+High-Density+Silicon+Microprobe+Arrays+for+Electronic+Depth+Control+in+Intracortical+Neural+Recording-Characterization+and+Application&rft.jtitle=Journal+of+microelectromechanical+systems&rft.au=Seidl%2C+K.&rft.au=Schwaerzle%2C+M.&rft.au=Ulbert%2C+I.&rft.au=Neves%2C+H.+P.&rft.date=2012-12-01&rft.pub=IEEE&rft.issn=1057-7157&rft.volume=21&rft.issue=6&rft.spage=1426&rft.epage=1435&rft_id=info:doi/10.1109%2FJMEMS.2012.2206564&rft.externalDocID=6249712
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1057-7157&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1057-7157&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1057-7157&client=summon