Concatenated BCH and LDPC Coding Scheme With Iterative Decoding Algorithm for Flash Memory

As adopting a very powerful error-correcting code gradually becomes a strategic demand for the endurance of nowadays flash memory, LDPC codes are recently proposed due to their outstanding error correcting capability. However, the error floor phenomenon of LDPC codes might not meet the extreme low e...

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Veröffentlicht in:IEEE communications letters Jg. 19; H. 3; S. 327 - 330
1. Verfasser: Shieh, Shin-Lin
Format: Journal Article
Sprache:Englisch
Veröffentlicht: New York IEEE 01.03.2015
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN:1089-7798, 1558-2558
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Abstract As adopting a very powerful error-correcting code gradually becomes a strategic demand for the endurance of nowadays flash memory, LDPC codes are recently proposed due to their outstanding error correcting capability. However, the error floor phenomenon of LDPC codes might not meet the extreme low error rate requirement of flash memory applications. Thus, concatenation of BCH and LDPC codes that strikes a balance between superb error correcting capability and low error floor becomes an alternative system structure. In this work, a modification of such concatenated coding system in Chen et al. [IEEE Commun. Lett., vol. 17, no. 5, pp. 980-983, May 2013] is proposed. Compared with the previous concatenated coding system via simulations, our design improves the error correcting capability in the waterfall region while keeps low error floor.
AbstractList As adopting a very powerful error-correcting code gradually becomes a strategic demand for the endurance of nowadays flash memory, LDPC codes are recently proposed due to their outstanding error correcting capability. However, the error floor phenomenon of LDPC codes might not meet the extreme low error rate requirement of flash memory applications. Thus, concatenation of BCH and LDPC codes that strikes a balance between superb error correcting capability and low error floor becomes an alternative system structure. In this work, a modification of such concatenated coding system in Chen et al. [IEEE Commun. Lett., vol. 17, no. 5, pp. 980-983, May 2013] is proposed. Compared with the previous concatenated coding system via simulations, our design improves the error correcting capability in the waterfall region while keeps low error floor.
Author Shin-Lin Shieh
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Cites_doi 10.1109/TIT.2004.831841
10.1109/ITA.2014.6804221
10.1109/LCOMM.2013.031913.130142
10.1109/LCOMM.2003.814716
10.1109/26.494301
10.1109/GLOCOMW.2010.5700263
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  doi: 10.1109/TIT.2004.831841
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  ident: ref2
  article-title: Error patterns in MLC NAND flash memory: Measurement, characterization, analysis
  publication-title: Proc Des Autom Test Eur Conf Exhib
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  year: 0
  ident: ref5
  article-title: Error floors of LDPC codes
  publication-title: Proc Allerton Conf Commun Control Comput
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  doi: 10.1109/ITA.2014.6804221
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  doi: 10.1109/LCOMM.2013.031913.130142
– year: 2004
  ident: ref4
  publication-title: Error Control Coding
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  doi: 10.1109/LCOMM.2003.814716
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  doi: 10.1109/26.494301
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SubjectTerms Ash
Bit error rate
Decoding
Encoding
Iterative decoding
Reliability
Title Concatenated BCH and LDPC Coding Scheme With Iterative Decoding Algorithm for Flash Memory
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