Multithreaded and Reconvergent Aware Algorithms for Accurate Digital Circuits Reliability Estimation

Until recently, reliability was not considered to be a major design concern for circuit designers, except in the case of space and mission critical applications. However, the aggressive scaling of CMOS devices has significantly affected their reliable operation. Several schemes have been used for mi...

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Bibliographic Details
Published in:	IEEE transactions on reliability Vol. 68; no. 2; pp. 514 - 525
Main Authors:	Ibrahim, Walid, Ibrahim, Hazem
Format:	Journal Article
Language:	English
Published:	New York IEEE 01.06.2019 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:	Algorithms Circuit design Circuit reliability CMOS Complexity theory Computer simulation Design Design automation Design parameters Designers Digital electronics Electronic design automation fault tolerance heuristic algorithms Integrated circuit reliability Logic circuits Logic gates parallel processing Redundancy reliability Reliability engineering Scaling Simulation
ISSN:	0018-9529, 1558-1721
Online Access:	Get full text
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