Oxygen-Dependent Instability and Annealing/Passivation Effects in Amorphous In-Ga-Zn-O Thin-Film Transistors

This letter discusses the reason for the instability of amorphous indium-gallium-zinc-oxide (a-IGZO) thin-film transistors (TFTs) under both positive and negative bias stresses. This instability is significantly influenced by the oxygen content in the bulk IGZO and the surrounding environment. The a...

Celý popis

Uloženo v:

Podrobná bibliografie
Vydáno v:	IEEE electron device letters Ročník 32; číslo 11; s. 1552 - 1554
Hlavní autoři:	Chen, Wei-Tsung, Lo, Shih-Yi, Kao, Shih-Chin, Zan, Hsiao-Wen, Tsai, Chuang-Chuang, Lin, Jian-Hong, Fang, Chun-Hsiang, Lee, Chung-Chun
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	New York, NY IEEE 01.11.2011 Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Témata:	Annealing Applied sciences Bias Bias stress Devices Electronics Exact sciences and technology IGZO Instability Logic gates Passivation Semiconductor devices Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Stability Stress Stresses Thermal stability Thin film transistors Transistors Amorphous material Oxygen Annealing Electric stress Gallium oxide Indium oxide Relaxation time Zinc IGZO Stress relaxation Zinc oxide Thin film transistor Bias stress stability Passivation
ISSN:	0741-3106, 1558-0563
On-line přístup:	Získat plný text
Tagy:	Přidat tag Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!

Buďte první, kdo okomentuje tento záznam!