Atomic-Level Insights into the Radiation Damage and Recovery of β-Ga2O3 for High-performance Semiconductors

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Bibliographic Details
Published in:	Microscopy and microanalysis Vol. 29; no. Supplement_1; p. 1472
Main Authors:	Huang, Hsien-Lien, Chae, Christopher, Johnson, Jared M, Senckowski, Alexander, Sharma, Shivam, Singisetti, Uttam, Wong, Man Hoi, Hwang, Jinwoo
Format:	Journal Article
Language:	English
Published:	England 22.07.2023
ISSN:	1435-8115
Online Access:	Get more information
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ISSN:	1435-8115
DOI:	10.1093/micmic/ozad067.756