Defect tolerant probabilistic design paradigm for nanotechnologies

Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the tremendous increase in device density of nanoelectronics will be accompanied by a substantial increase in hard and soft fault...

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Podrobná bibliografia
Vydané v:	Proceedings - ACM IEEE Design Automation Conference s. 596 - 601
Hlavní autori:	Jacome, Margarida, He, Chen, de Veciana, Gustavo, Bijansky, Stephen
Médium:	Konferenčný príspevok..
Jazyk:	English
Vydavateľské údaje:	New York, NY, USA ACM 07.06.2004 IEEE
Edícia:	ACM Conferences
Predmet:	Applied computing > Arts and humanities > Architecture (buildings) > Computer-aided design Applied computing > Physical sciences and engineering > Engineering > Computer-aided design Computer aided manufacturing Costs Design methodology Helium Nanoelectronics Nanoscale devices Scalability Self-assembly Silicon Uncertainty nanotechnologies probabilistic design defect tolerance
ISBN:	1581138288, 9781581138283, 1511838288
ISSN:	0738-100X
On-line prístup:	Získať plný text
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