Defect tolerant probabilistic design paradigm for nanotechnologies

Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the tremendous increase in device density of nanoelectronics will be accompanied by a substantial increase in hard and soft fault...

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Vydané v:Proceedings - ACM IEEE Design Automation Conference s. 596 - 601
Hlavní autori: Jacome, Margarida, He, Chen, de Veciana, Gustavo, Bijansky, Stephen
Médium: Konferenčný príspevok..
Jazyk:English
Vydavateľské údaje: New York, NY, USA ACM 07.06.2004
IEEE
Edícia:ACM Conferences
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ISBN:1581138288, 9781581138283, 1511838288
ISSN:0738-100X
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Popis
Shrnutí:Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the tremendous increase in device density of nanoelectronics will be accompanied by a substantial increase in hard and soft faults, posing a major challenge to current design methodologies and tools. In this paper we propose a novel probabilistic design paradigm for defective but reconfigurable nanofabrics. The new design goal is to devise an appropriate structural/behavioral decomposition which improves scalability by constraining the reconfiguration process, while meeting a desired probability of successful instantiation, i.e, yield. Our approach not only addresses the scalability problem in configuring dense nanofabrics subject to defects, but gives a rich framework in which critical trade-offs among performance, yield, and per chip cost can be explored. We present a concrete instance of the approach and show extensive experimental results supporting these claims.
ISBN:1581138288
9781581138283
1511838288
ISSN:0738-100X
DOI:10.1145/996566.996730