Defect tolerant probabilistic design paradigm for nanotechnologies
Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the tremendous increase in device density of nanoelectronics will be accompanied by a substantial increase in hard and soft fault...
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| Vydané v: | Proceedings - ACM IEEE Design Automation Conference s. 596 - 601 |
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| Hlavní autori: | , , , |
| Médium: | Konferenčný príspevok.. |
| Jazyk: | English |
| Vydavateľské údaje: |
New York, NY, USA
ACM
07.06.2004
IEEE |
| Edícia: | ACM Conferences |
| Predmet: | |
| ISBN: | 1581138288, 9781581138283, 1511838288 |
| ISSN: | 0738-100X |
| On-line prístup: | Získať plný text |
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| Shrnutí: | Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the tremendous increase in device density of nanoelectronics will be accompanied by a substantial increase in hard and soft faults, posing a major challenge to current design methodologies and tools. In this paper we propose a novel probabilistic design paradigm for defective but reconfigurable nanofabrics. The new design goal is to devise an appropriate structural/behavioral decomposition which improves scalability by constraining the reconfiguration process, while meeting a desired probability of successful instantiation, i.e, yield. Our approach not only addresses the scalability problem in configuring dense nanofabrics subject to defects, but gives a rich framework in which critical trade-offs among performance, yield, and per chip cost can be explored. We present a concrete instance of the approach and show extensive experimental results supporting these claims. |
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| ISBN: | 1581138288 9781581138283 1511838288 |
| ISSN: | 0738-100X |
| DOI: | 10.1145/996566.996730 |

