Proceedings, IEEE International Joint Symposia on Intelligence and Systems : November 4-5, 1996, Rockville, Maryland

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Bibliographic Details
Main Authors: IEEE International Joint Symposia on Intelligence and Systems, IEEE Computer Society, IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence
Format: Book
Language:English
Published: Los Alamitos, Calif IEEE Computer Society Press 1996
Subjects:
ISBN:0818677287, 9780818677304, 9780818677281, 0818677309
Online Access:Get full text
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