Testing and Debugging Quantum Circuits
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| Published in: | IEEE Transactions on Quantum Engineering Vol. 5; pp. 1 - 15 |
|---|---|
| Main Authors: | , |
| Format: | Journal Article |
| Language: | Japanese |
| Published: |
Institute of Electrical and Electronics Engineers (IEEE)
01.01.2024
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| Subjects: | |
| ISSN: | 2689-1808 |
| Online Access: | Get full text |
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| Author | Sara Ayman Metwalli Rodney Van Meter |
|---|---|
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| DOI | 10.48550/arxiv.2311.18202 10.1109/tqe.2024.3374879 |
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| PublicationTitle | IEEE Transactions on Quantum Engineering |
| PublicationYear | 2024 |
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
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| SubjectTerms | Atomic physics. Constitution and properties of matter Debugging FOS: Physical sciences Materials of engineering and construction. Mechanics of materials QC170-197 Quantum Physics Quantum Physics (quant-ph) quantum programs quantum software TA401-492 testing |
| Title | Testing and Debugging Quantum Circuits |
| URI | https://cir.nii.ac.jp/crid/1872835442732527616 |
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