Testing and Debugging Quantum Circuits
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| Published in: | IEEE Transactions on Quantum Engineering Vol. 5; pp. 1 - 15 |
|---|---|
| Main Authors: | , |
| Format: | Journal Article |
| Language: | Japanese |
| Published: |
Institute of Electrical and Electronics Engineers (IEEE)
01.01.2024
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| Subjects: | |
| ISSN: | 2689-1808 |
| Online Access: | Get full text |
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| Author | Sara Ayman Metwalli Rodney Van Meter |
|---|---|
| Author_xml | – sequence: 1 orcidid: 0000-0002-9874-2306 fullname: Sara Ayman Metwalli – sequence: 2 orcidid: 0000-0002-5044-9514 fullname: Rodney Van Meter |
| BackLink | https://cir.nii.ac.jp/crid/1872835442732527616$$DView record in CiNii |
| BookMark | eNotjM1KxDAURoMoOI7zAO66EHet9978dinVUWFAhO4lvUlKBo0wbcXH10E33-EsznchTstniUJcITTKaQ23_vCdvxqSiA06AjoRKzKurdGBOxebadoDAGlEA7QSN32c5lzGypdQ3cdhGcejvS6-zMtH1eUDL3meLsVZ8u9T3PxzLfrtQ9891buXx-fublfvW21q6dh5qQL41PowgG01sAyaCawKrIkZOYEhNhb8EHyIUQUnk0waf2O5Ftd_tyXnN87HRWfJSa0UWUmarEEjfwDLeEGl |
| ContentType | Journal Article |
| DBID | RYH |
| DOI | 10.48550/arxiv.2311.18202 10.1109/tqe.2024.3374879 |
| DatabaseName | CiNii Complete |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Physics |
| EISSN | 2689-1808 |
| EndPage | 15 |
| GroupedDBID | 0R~ AAFWJ ABAZT ABJNI ABVLG AFPKN ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ EBS ESBDL GROUPED_DOAJ IEDLZ JAVBF M~E OCL OK1 RYH |
| ID | FETCH-LOGICAL-j956-38c8a34d0af9adb07950c3d5c2074dc52cc1cf062c670abdadee4d83f3f5138c3 |
| IngestDate | Mon Nov 10 09:09:32 EST 2025 |
| IsDoiOpenAccess | true |
| IsOpenAccess | true |
| IsPeerReviewed | true |
| IsScholarly | true |
| Language | Japanese |
| LinkModel | OpenURL |
| MergedId | FETCHMERGED-LOGICAL-j956-38c8a34d0af9adb07950c3d5c2074dc52cc1cf062c670abdadee4d83f3f5138c3 |
| ORCID | 0000-0002-9874-2306 0000-0002-5044-9514 |
| OpenAccessLink | http://dx.doi.org/10.48550/arxiv.2311.18202 |
| PageCount | 15 |
| ParticipantIDs | nii_cinii_1872835442732527616 |
| PublicationCentury | 2000 |
| PublicationDate | 2024-01-01 |
| PublicationDateYYYYMMDD | 2024-01-01 |
| PublicationDate_xml | – month: 01 year: 2024 text: 2024-01-01 day: 01 |
| PublicationDecade | 2020 |
| PublicationTitle | IEEE Transactions on Quantum Engineering |
| PublicationYear | 2024 |
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher_xml | – name: Institute of Electrical and Electronics Engineers (IEEE) |
| SSID | ssj0002511602 ssib042470376 |
| Score | 2.3638718 |
| SourceID | nii |
| SourceType | Publisher |
| StartPage | 1 |
| SubjectTerms | Atomic physics. Constitution and properties of matter Debugging FOS: Physical sciences Materials of engineering and construction. Mechanics of materials QC170-197 Quantum Physics Quantum Physics (quant-ph) quantum programs quantum software TA401-492 testing |
| Title | Testing and Debugging Quantum Circuits |
| URI | https://cir.nii.ac.jp/crid/1872835442732527616 |
| Volume | 5 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVAON databaseName: DOAJ Directory of Open Access Journals databaseCode: DOA dateStart: 20200101 customDbUrl: isFulltext: true eissn: 2689-1808 dateEnd: 99991231 titleUrlDefault: https://www.doaj.org/ omitProxy: false ssIdentifier: ssj0002511602 providerName: Directory of Open Access Journals – providerCode: PRVHPJ databaseName: ROAD: Directory of Open Access Scholarly Resources databaseCode: M~E dateStart: 20200101 customDbUrl: isFulltext: true eissn: 2689-1808 dateEnd: 99991231 titleUrlDefault: https://road.issn.org omitProxy: false ssIdentifier: ssj0002511602 providerName: ISSN International Centre |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV3NT9RAFJ8oauLFIGoAgfRAvJAu7XQ-j4Qs8SKRZGO4kfnomBKo0t3icuFv5810WsrGRD14mWzadDLte_ub9zW_h9C-MlSXwuk0Mz7NiBlOdcFkijXstcpZWuosNJvgp6fi_Fx-jfXz89BOgNe1WC7lz_8qargGwvZHZ_9B3MOkcAF-g9BhBLHD-HeC97wZ8eQhoEn7PbQhOmvhE7bXB8dVY9qqo2_qjVLv8HUs590ph5BB6B8YERYO0RjVqIOju-uQ51n8UldX1WPextaAMt-6W7HyNwYVMFkJKjwpVJiGfjwDd8F0aM8zH5YQAsR-sX34ogwIhpmQaS4yMYZbOoLLfLTvdqc6VxE9EK75_apZVrcTMEbziaecx79H_0Ceurjx9KeYTApPrcPlc_QCcyp9vd-X-2kPNgQTALtoi_lt2_tazFd7bcapDlcn6pLiYUWHq-sB06SuqpFpMltHb6JPkRx1uvAWPbtUG-hVqO0183foU9SIBL5rMmhEEgWc9BrxHs1OprPjz2lsj5FeevLIQhihCmIz5aSyOuOSwv_NUoPBKrSGYmNy4zKGDeOZ0lbZsiRWFK5wNIeHiw9orf5Rl5soEY5jZjx1GzjPmiuNmRPEyMyVGhwKvoV24eUuTOXHXHDP0UcIGL6YYs5ytv2H-x_R60cl20Fri6Ytd9FLc7uo5s1eCIPsBeE8AHlkRoQ |
| linkProvider | ISSN International Centre |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Testing+and+Debugging+Quantum+Circuits&rft.jtitle=IEEE+Transactions+on+Quantum+Engineering&rft.au=Sara+Ayman+Metwalli&rft.au=Rodney+Van+Meter&rft.date=2024-01-01&rft.pub=Institute+of+Electrical+and+Electronics+Engineers+%28IEEE%29&rft.eissn=2689-1808&rft.volume=5&rft.spage=1&rft.epage=15&rft_id=info:doi/10.48550%2Farxiv.2311.18202&rft_id=info:doi/10.1109%2Ftqe.2024.3374879 |