Unsupervised Autoencoder Approach for Precise Line-Type Mura Detection and Classification

Mura refers to surface defects or uneven brightness in panel manufacturing and is classified by severity into light Mura and serious Mura. Due to limited data, traditional object detection is not feasible. Instead, we propose an unsupervised method to classify serious Mura and accurately localize de...

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Bibliographic Details

Published in:	IEEE International Conference on Consumer Electronics-China (Online) pp. 507 - 508
Main Authors:	Chang, Ting-Yu, Lin, Chia-Yu
Format:	Conference Proceeding
Language:	English
Published:	IEEE 16.07.2025
Subjects:	Anomaly localization Autoencoder Autoencoders Computational modeling Consumer electronics Defect detection Inspection Location awareness Manufacturing mura detection Object detection Quality control Unsupervised learning
ISSN:	2575-8284
Online Access:	Get full text
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