Online error detection in SRAM based FPGAs using Scalable Error Detection Coding

SRAM based devices are more susceptible to unidirectional errors when exposed to radiations. This paper presents an error detection scheme for detecting errors in SRAM cells of FPGA. This proposed Scalable Error Detection Coding (SEDC) scheme is capable of detecting 100% unidirectional errors. SEDC...

Celý popis

Uloženo v:

Podrobná bibliografie
Vydáno v:	2013 5th Asia Symposium on Quality Electronic Design (ASQED) s. 321 - 324
Hlavní autoři:	Siddiqui, Zahid Ali, Jeong-A Lee
Médium:	Konferenční příspěvek
Jazyk:	angličtina
Vydáno:	IEEE 01.08.2013
Témata:	Encoding error detection coding Fault tolerance Field programmable gate arrays FPGA Generators Logic gates Look-up table function Programming self-checking circuits Table lookup Tunneling magnetoresistance
On-line přístup:	Získat plný text
Tagy:	Přidat tag Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!

Popis
Shrnutí:	SRAM based devices are more susceptible to unidirectional errors when exposed to radiations. This paper presents an error detection scheme for detecting errors in SRAM cells of FPGA. This proposed Scalable Error Detection Coding (SEDC) scheme is capable of detecting 100% unidirectional errors. SEDC scheme partitions the data into segments of 2-, 3- and 4-bits data and encodes these segments using SEDC codes, in parallel fashion. The programming device generates the SEDC check bits and stores them on the FPGA's SRAM cells. A high speed, compact and easily scalable online SEDC check bit generator generates the SEDC check bits, which are compared with the pre-stored check bits during circuit operation. All unidirectional errors in SRAM cells, caused by cosmic radiations, are detected. The proposed technique achieves significant improvement in area as well as speed over Berger & simple TMR technique for the same application.
DOI:	10.1109/ASQED.2013.6643606