Conditionally Executed Tests, Branching and Algorithmic Binning - Getting IT Right
Test programs for large SOCs contain complex flow and binning logic. To perform tasks such as memory repair, trimming and speed binning, flows are non-deterministic and incorporate branching, loops and conditional test execution. Binning decisions are made based on elaborate algorithms. Testing mult...
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| Published in: | 2022 China Semiconductor Technology International Conference (CSTIC) pp. 1 - 3 |
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| Main Author: | |
| Format: | Conference Proceeding |
| Language: | English |
| Published: |
IEEE
20.06.2022
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| Subjects: | |
| Online Access: | Get full text |
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| Summary: | Test programs for large SOCs contain complex flow and binning logic. To perform tasks such as memory repair, trimming and speed binning, flows are non-deterministic and incorporate branching, loops and conditional test execution. Binning decisions are made based on elaborate algorithms. Testing multiple devices in parallel adds another dimension of complexity, which increases the possibility of coding errors. To eliminate such errors, the test program needs to be checked. Current methods of verification have drawbacks. This paper introduces a tool that addresses the deficiencies using speed binning as an example. |
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| DOI: | 10.1109/CSTIC55103.2022.9856766 |