Possible Approaches to Organizing Self-Test of a Self-Routing Analog-To-Digital Converter Based on a Neural Network

The article provides a review of the literature on the development of a self-routing analog-to-digital converter (ADC) based on a neural network (SRADC NN). The advantages and disadvantages of SRADC NN are described. Approaches to the implementation of self-testing algorithms of the device are propo...

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Bibliographic Details

Published in:	IEEE NW Russia Young Researchers in Electrical and Electronic Engineering Conference pp. 391 - 394
Main Authors:	Naborshchikov, Anton A., Yuzhakov, Alexander A., Posyagin, Anton I.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 25.01.2022
Subjects:	Aging analog-to-digital converter Artificial neural networks Built-in self-test Capacitance Costs fault tolerance Hardware majorization neural network Resistors self-test system
ISSN:	2376-6565
Online Access:	Get full text
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