Limits of compensation in a failed antenna array

ABSTRACT In large antenna arrays, the possibility of occurrence of faults in some of the radiating elements cannot be precluded at all times. In such situations, the radiation pattern of the array gets distorted, mostly with an increase in sidelobe level and decrease in gain. Although it is not poss...

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Vydané v:International journal of RF and microwave computer-aided engineering Ročník 24; číslo 6; s. 635 - 645
Hlavní autori: Acharya, Om Prakash, Patnaik, Amalendu, Sinha, Sachendra Nath
Médium: Journal Article
Jazyk:English
Vydavateľské údaje: Hoboken Blackwell Publishing Ltd 01.11.2014
John Wiley & Sons, Inc
Predmet:
Antenna arrays
Arrays
Compensation
Excitation
failed antenna arrays
Failure
Microwaves
Optimization
particle swarm optimization
sidelobe level
Sidelobes
ISSN:1096-4290, 1099-047X
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Shrnutí:ABSTRACT In large antenna arrays, the possibility of occurrence of faults in some of the radiating elements cannot be precluded at all times. In such situations, the radiation pattern of the array gets distorted, mostly with an increase in sidelobe level and decrease in gain. Although it is not possible to restore the pattern fully by rearranging the excitations of the functioning elements, compensation methods have been reported in the literature for restoring one performance parameter of the array and making a trade‐off on some other parameter. In this article, we have made a study on the tolerance level of this compensation process. One part of the study deals with the thinning in the failed array, that is, to find a limit on the minimum number of functioning elements of the array that can restore the digital beamforming of the failed array. The second part of study deals with finding the maximum number of element failures that can be compensated. The study was carried out by optimizing the amplitude excitations of the failed array. Instead of classical optimization techniques, particle swarm optimization was used for the compensation process. © 2014 Wiley Periodicals, Inc. Int J RF and Microwave CAE 24:635–645, 2014.
Bibliografia:ark:/67375/WNG-3PVSPRQX-B
istex:BBF7F00D36417BCC5F088C764D14F7C14B537082
ArticleID:MMCE20807
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
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ISSN:1096-4290
1099-047X
DOI:10.1002/mmce.20807