Defect consideratons for robust sparse coding using memristor arrays

The performance of a memristor network with defects is investigated on a sparse coding task. It was found that moderate levels SA0 faults do not significantly impact algorithm performance, while SA1 faults effectively reduce dictionary size.

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Vydané v:IEEE International Symposium on Nanoscale Architectures s. 137 - 138
Hlavní autori: Sheridan, Patrick, Lu, Wei D.
Médium: Konferenčný príspevok..
Jazyk:English
Vydavateľské údaje: IEEE 01.07.2015
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Dictionaries
Electrodes
Encoding
fault tolerance
Memristor
Memristors
Neurons
Performance evaluation
sparse coding
Training
ISSN:2327-8218
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Shrnutí:The performance of a memristor network with defects is investigated on a sparse coding task. It was found that moderate levels SA0 faults do not significantly impact algorithm performance, while SA1 faults effectively reduce dictionary size.
ISSN:2327-8218
DOI:10.1109/NANOARCH.2015.7180600