Improved technology mapping for PAL-based devices using a new approach to multi-output boolean functions

An effective technology mapping for PAL-based devices is presented in this paper. The aim of this method is to cover a multiple-output function by a minimal number of PAL-based logic blocks. The product terms included in a logic block can be shared by several functions. Experimental results are comp...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Proceedings - Design, Automation, and Test in Europe Conference and Exhibition S. 1087
1. Verfasser: Kania, D.
Format: Tagungsbericht
Sprache:Englisch
Veröffentlicht: IEEE 2002
Schlagworte:
Automatic testing
Boolean functions
Design automation
Europe
IEEE Computer Society Press
Joining processes
Kernel
Logic devices
ISBN:0769514715, 9780769514710
ISSN:1530-1591
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:An effective technology mapping for PAL-based devices is presented in this paper. The aim of this method is to cover a multiple-output function by a minimal number of PAL-based logic blocks. The product terms included in a logic block can be shared by several functions. Experimental results are compared to the classical technology mapping method.
Bibliographie:SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
content type line 25
ISBN:0769514715
9780769514710
ISSN:1530-1591
DOI:10.1109/DATE.2002.998444