Algorithm-Based Fault Tolerance for Parallel Stencil Computations

The increase in HPC systems size and complexity, together with increasing on-chip transistor density, power limitations, and number of components, render modern HPC systems subject to soft errors. Silent data corruptions (SDCs) are typically caused by such soft errors in the form of bit-flips in the...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:Proceedings / IEEE International Conference on Cluster Computing s. 1 - 11
Hlavní autoři: Cavelan, Aurelien, Ciorba, Florina M.
Médium: Konferenční příspěvek
Jazyk:angličtina
Vydáno: IEEE 01.09.2019
Témata:
ISSN:2168-9253
On-line přístup:Získat plný text
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
Popis
Shrnutí:The increase in HPC systems size and complexity, together with increasing on-chip transistor density, power limitations, and number of components, render modern HPC systems subject to soft errors. Silent data corruptions (SDCs) are typically caused by such soft errors in the form of bit-flips in the memory subsystem and hinder the correctness of scientific applications. This work addresses the problem of protecting a class of iterative computational kernels, called stencils, against SDCs when executing on parallel HPC systems. Existing SDC detection and correction methods are in general either inaccurate, inefficient, or targeting specific application classes that do not include stencils. This work proposes a novel algorithm-based fault tolerance (ABFT) method to protect scientific applications that contain arbitrary stencil computations against SDCs. The ABFT method can be applied both online and offline to accurately detect and correct SDCs in 2D and 3D parallel stencil computations. We present a formal model for the proposed method including theorems and proofs for the computation of the associated check-sums as well as error detection and correction. We experimentally evaluate the use of the proposed ABFT method on a real 3D stencil-based application (HotSpot3D) via a fault-injection, detection, and correction campaign. Results show that the proposed ABFT method achieves less than 8% overhead compared to the performance of the unprotected stencil application. Moreover, it accurately detects and corrects SDCs. While the offline ABFT version corrects errors more accurately, it may incur a small additional overhead than its online counterpart.
ISSN:2168-9253
DOI:10.1109/CLUSTER.2019.8891034