Robust Sparse Arrays with Multiple-Fold Redundant Difference Coarrays

Spares arrays can attain O(N^{2}) degrees of freedom (DOF) usingonly N physical sensors, which profits from the O(N^{2}) length of the central uniform linear array (ULA) segment in their difference coarray (DCA). To obtain the optimal DOF performance, the single-fold redundant DCA (that is, each ele...

Full description

Saved in:
Bibliographic Details
Published in:2019 IEEE International Conference on Signal, Information and Data Processing (ICSIDP) pp. 1 - 4
Main Authors: Zhu, Dong, Li, Gang
Format: Conference Proceeding
Language:English
Published: IEEE 01.12.2019
Subjects:
Array signal processing
Data processing
Degrees of freedom
Design methodology
difference coarray
Geometry
multiple-fold redundancy arrays
Redundancy
Robustness
Sensor arrays
sensor failures
Sensors
sparse arrays
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Spares arrays can attain O(N^{2}) degrees of freedom (DOF) usingonly N physical sensors, which profits from the O(N^{2}) length of the central uniform linear array (ULA) segment in their difference coarray (DCA). To obtain the optimal DOF performance, the single-fold redundant DCA (that is, each element of DCA occurs as only once as possible) is persistently pursued in array design. Such a criterion inevitably leads this {O}(N^{2}) ULA segment susceptible to sensor failures, which is a crucial issue concerning array/DCA robustness (or system reliability) in practical applications. That is quite serious for minimum/low-redundancy, nested, and coprime configurations as well as their variations. This paper introduces a novel sparse array geometry, named multiple-fold redundancy array (MFRA), exploiting element redundancies of the DCA. The MFRA is more robust to sensor failures than the aforementioned sparse arrays, for which the concepts of quasi-essentialness and reliability is introduced. Several numerical examples are presented to demonstrate the MFRA's robustness to sensor failures.
DOI:10.1109/ICSIDP47821.2019.9173295