Fast, minimal decoding complexity, system level, binary systematic (41, 32) single-error-correcting codes for on-chip DRAM applications
Fast, minimal decoding complexity, system level, binary systematic (41, 32) single-error-correcting codes for on-chip DRAM applications are presented. These (41, 32) codes allow fast single error correcting with three parity bit penalty and can be used in combinational circuits with minimal (ultimat...
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| Published in: | Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems pp. 308 - 313 |
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| Main Authors: | , |
| Format: | Conference Proceeding |
| Language: | English |
| Published: |
IEEE
2001
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| Subjects: | |
| ISBN: | 9780769512037, 0769512038 |
| ISSN: | 1550-5774 |
| Online Access: | Get full text |
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