Functional Dependence

Functional dependence takes place when the malfunction of one system component causes other components within the same system to become unusable or inaccessible. The functional dependence behavior is modeled via Functional DEPendence (FDEP) gates in the dynamic fault tree (FT) analysis. This chapter...

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Veröffentlicht in:Dynamic System Reliability S. 61 - 82
Hauptverfasser: Xing, Liudong, Levitin, Gregory, Wang, Chaonan
Format: Buchkapitel
Sprache:Englisch
Veröffentlicht: United Kingdom Wiley 2019
John Wiley & Sons, Incorporated
John Wiley & Sons, Ltd
Ausgabe:1
Schriftenreihe:Quality and Reliability Engineering Series
Schlagworte:
combinatorial algorithm
combined trigger event
dual‐role events
fault tree analysis method
functional dependence
logic OR replacement method
shared dependent event
total probability law
Analytical models
Computational modeling
Discrete Fourier transforms
Logic gates
Reliability
Task analysis
Fault trees
ISBN:1119507634, 9781119507635
Online-Zugang:Volltext
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Beschreibung
Zusammenfassung:Functional dependence takes place when the malfunction of one system component causes other components within the same system to become unusable or inaccessible. The functional dependence behavior is modeled via Functional DEPendence (FDEP) gates in the dynamic fault tree (FT) analysis. This chapter discusses a logic OR replacement method for the reliability analysis of systems with FDEP and perfect fault coverage. It presents a combinatorial approach for reliability analysis of systems subject to imperfect fault coverage. The combinatorial algorithm can handle various complicated cases including cascading FDEPs, combined trigger events, shared dependent events, and dual‐role events. The algorithm, which practices the divide and conquer principle based on the total probability law, is computationally efficient. The reduced reliability problems generated are simplified and independent problems without FDEP, which can be solved in parallel given available computing resources using any traditional FT analysis method.
ISBN:1119507634
9781119507635
DOI:10.1002/9781119507642.ch5