Visual tracking via incremental Log-Euclidean Riemannian subspace learning

Recently, a novel Log-Euclidean Riemannian metric is proposed for statistics on symmetric positive definite (SPD) matrices. Under this metric, distances and Riemannian means take a much simpler form than the widely used affine-invariant Riemannian metric. Based on the Log-Euclidean Riemannian metric...

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Vydáno v:2008 IEEE Conference on Computer Vision and Pattern Recognition s. 1 - 8
Hlavní autoři: Xi Li, Weiming Hu, Zhongfei Zhang, Xiaoqin Zhang, Mingliang Zhu, Jian Cheng
Médium: Konferenční příspěvek
Jazyk:angličtina
Vydáno: IEEE 01.06.2008
Témata:
Cameras
Covariance matrix
Inference algorithms
Kernel
Lighting
Particle filters
Particle tracking
Principal component analysis
Robustness
Statistics
ISBN:9781424422425, 1424422426
ISSN:1063-6919, 1063-6919
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Shrnutí:Recently, a novel Log-Euclidean Riemannian metric is proposed for statistics on symmetric positive definite (SPD) matrices. Under this metric, distances and Riemannian means take a much simpler form than the widely used affine-invariant Riemannian metric. Based on the Log-Euclidean Riemannian metric, we develop a tracking framework in this paper. In the framework, the covariance matrices of image features in the five modes are used to represent object appearance. Since a nonsingular covariance matrix is a SPD matrix lying on a connected Riemannian manifold, the Log-Euclidean Riemannian metric is used for statistics on the covariance matrices of image features. Further, we present an effective online Log-Euclidean Riemannian subspace learning algorithm which models the appearance changes of an object by incrementally learning a low-order Log-Euclidean eigenspace representation through adaptively updating the sample mean and eigenbasis. Tracking is then led by the Bayesian state inference framework in which a particle filter is used for propagating sample distributions over the time. Theoretic analysis and experimental evaluations demonstrate the promise and effectiveness of the proposed framework.
ISBN:9781424422425
1424422426
ISSN:1063-6919
1063-6919
DOI:10.1109/CVPR.2008.4587516