Deep learning framework for analyzing birefringence imaging by incorporating optical polarization overlap in stress-induced ferroelectric SrTiO3

Optical microscopy is vital in many scientific fields, and various super-resolution techniques have been developed to overcome the resolution limit that restricts the separation of spatially mixed light. However, conventional methods inherently cannot resolve overlapping optical polarization (OP) co...

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Vydané v:Science and technology of advanced materials. Methods Ročník 5; číslo 1
Hlavní autori: Hirotaka Manaka, Shoutarou Katayama, Soichiro Honda, Yoko Miura
Médium: Journal Article
Jazyk:English
Vydavateľské údaje: Taylor & Francis Group 31.12.2025
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ISSN:2766-0400
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