Enhanced fault detection in digital VLSI circuits using convolutional autoencoders

As Very Large-Scale Integration (VLSI) technology advances, the demand for reliable and scalable pre-silicon fault detection (FD) techniques continues to grow. Conventional diagnostic methods often face limitations in identifying subtle stuck-at faults within complex and high-dimensional test data....

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Bibliographic Details

Published in:	Integration (Amsterdam) Vol. 107; p. 102608
Main Authors:	Savalam, Chandrasekhar, Medisetti, Sanjay, Korapati, Prasanti
Format:	Journal Article
Language:	English
Published:	Elsevier B.V 01.03.2026
Subjects:	Contractive autoencoder Convolutional autoencoder Deep learning Digital VLSI circuits Error debugging Stacked sparse autoencoders Variational autoencoder Deep learning Contractive autoencoder Error debugging Stacked sparse autoencoders Variational autoencoder Convolutional autoencoder Digital VLSI circuits
ISSN:	0167-9260
Online Access:	Get full text
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