Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications"
Presents corrections to the paper, (Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications").
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| Vydáno v: | IEEE transactions on instrumentation and measurement Ročník 74; s. 1 |
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| Hlavní autoři: | , , , |
| Médium: | Journal Article |
| Jazyk: | angličtina |
| Vydáno: |
New York
IEEE
2025
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Témata: | |
| ISSN: | 0018-9456, 1557-9662 |
| On-line přístup: | Získat plný text |
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| Shrnutí: | Presents corrections to the paper, (Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications"). |
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| Bibliografie: | ObjectType-Correction/Retraction-1 SourceType-Scholarly Journals-1 content type line 14 |
| ISSN: | 0018-9456 1557-9662 |
| DOI: | 10.1109/TIM.2025.3561610 |