Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications"

Presents corrections to the paper, (Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications").

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Veröffentlicht in:IEEE transactions on instrumentation and measurement Jg. 74; S. 1
Hauptverfasser: Kang, Junho, Han, Woosol, Kim, Suhwan, Jun, Jaehoon
Format: Journal Article
Sprache:Englisch
Veröffentlicht: New York IEEE 2025
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Schlagworte:
Performance evaluation
ISSN:0018-9456, 1557-9662
Online-Zugang:Volltext
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Zusammenfassung:Presents corrections to the paper, (Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications").
Bibliographie:ObjectType-Correction/Retraction-1
SourceType-Scholarly Journals-1
content type line 14
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2025.3561610