APA (7th ed.) Citation

Kang, J., Han, W., Kim, S., & Jun, J. (2025). Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications". IEEE transactions on instrumentation and measurement, 74, 1. https://doi.org/10.1109/TIM.2025.3561610

Chicago Style (17th ed.) Citation

Kang, Junho, Woosol Han, Suhwan Kim, and Jaehoon Jun. "Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ F Corner for DC Measurement Applications"." IEEE Transactions on Instrumentation and Measurement 74 (2025): 1. https://doi.org/10.1109/TIM.2025.3561610.

MLA (9th ed.) Citation

Kang, Junho, et al. "Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ F Corner for DC Measurement Applications"." IEEE Transactions on Instrumentation and Measurement, vol. 74, 2025, p. 1, https://doi.org/10.1109/TIM.2025.3561610.