Aberration correction in stimulated emission depletion microscopy to increase imaging depth in living brain tissue

Significance: Stimulated emission depletion (STED) microscopy enables nanoscale imaging of live samples, but it requires a specific spatial beam shaping that is highly sensitive to optical aberrations, limiting its depth penetration. Therefore, there is a need for methods to reduce optical aberratio...

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Bibliographic Details
Published in:	Neurophotonics (Print) Vol. 8; no. 3; p. 035001
Main Authors:	Bancelin, Stéphane, Mercier, Luc, Murana, Emanuele, Nägerl, U. Valentin
Format:	Journal Article
Language:	English
Published:	Bellingham Society of Photo-Optical Instrumentation Engineers 01.07.2021 S P I E - International Society for Society of Photo-optical Instrumentation Engineers (SPIE)
Subjects:	Approximation Astigmatism Brain slice preparation Engineering Sciences Lasers Microscopy Morphology Nanoparticles Neuroimaging Optics Photonic Photonics Polynomials Research Papers Spatial discrimination aberration correction stimulated emission depletion microscopy brain slice imaging
ISSN:	2329-423X, 2329-4248
Online Access:	Get full text
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