Sparse coding-based multiframe superresolution for efficient synchrotron radiation microspectroscopy

In nanostructure extraction, advanced techniques like synchrotron radiation and electron microscopy are often hindered by radiation damage and charging artifacts from long exposure times. This study presents a multiframe superresolution method using sparse coding to enhance synchrotron radiation mic...

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Vydané v:	Discover nano Ročník 20; číslo 1; s. 102
Hlavní autori:	Igarashi, Yasuhiko, Nagamura, Naoka, Sekine, Masahiro, Fukidome, Hirokazu, Hino, Hideitsu, Okada, Masato
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	New York Springer US 03.07.2025 Springer Nature B.V Springer
Predmet:	Algorithms Chemical analysis Chemistry and Materials Science Coding data collection Datasets Deep learning Degradation Dictionaries Electron microscopy Exposure exposure duration High resolution High-resolution microscopy Image quality Image reconstruction Image resolution Materials Science Measurement image analysis Measurement techniques Methods Microscopes Microscopy Misalignment Molecular Medicine Nanochemistry nanomaterials Nanoscale Science and Technology Nanostructure Nanostructure image enhancement Nanotechnology Nanotechnology and Microengineering Neural networks Radiation Radiation damage Radiation damage reduction Radiation effects Sparse coding superresolution Spatial discrimination learning Spatial resolution Spectroscopy Spectrum analysis Synchrotron image reconstruction Synchrotron radiation Time measurement X-rays Nanostructure image enhancement Radiation damage reduction Sparse coding superresolution Synchrotron image reconstruction High-resolution microscopy Measurement image analysis
ISSN:	2731-9229, 1931-7573, 2731-9229, 1556-276X
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