Automated Crystal Orientation Mapping in py4DSTEM using Sparse Correlation Matching

Crystalline materials used in technological applications are often complex assemblies composed of multiple phases and differently oriented grains. Robust identification of the phases and orientation relationships from these samples is crucial, but the information extracted from the diffraction condi...

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Vydáno v:	Microscopy and microanalysis Ročník 28; číslo 2; s. 390 - 403
Hlavní autoři:	Ophus, Colin, Zeltmann, Steven E., Bruefach, Alexandra, Rakowski, Alexander, Savitzky, Benjamin H., Minor, Andrew M., Scott, Mary C.
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	New York, USA Cambridge University Press 01.04.2022 Oxford University Press Microscopy Society of America (MSA)
Témata:	Algorithms automated crystal orientation mapping (ACOM) Automation Crystal structure Datasets Diffraction Diffraction patterns Electron beams Electron probe Electron probes Experiments four-dimensional scanning Grains Libraries Machine learning Mapping MATERIALS SCIENCE Methods nanobeam electron diffraction (NBED) Nanotechnology Nanowires open-source software Orientation relationships Point defects Scanning electron microscopy scanning electron nanodiffraction (SEND) Software and Instrumentation Source code Transmission electron microscopy transmission electron microscopy (4D-STEM) automated crystal orientation mapping (ACOM) open-source software nanobeam electron diffraction (NBED) scanning electron nanodiffraction (SEND) four-dimensional scanning transmission electron microscopy (4D-STEM)
ISSN:	1431-9276, 1435-8115, 1435-8115
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