Intelligent Sensors for dc Fault Location Scheme Based on Optimized Intelligent Architecture for HVdc Systems

We develop a probabilistic model for determining the location of dc-link faults in MT-HVdc networks using discrete wavelet transforms (DWTs), Bayesian optimization, and multilayer artificial neural networks (ANNs) based on local information. Likewise, feedforward neural networks (FFNNs) are trained...

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Bibliographic Details
Published in:Sensors (Basel, Switzerland) Vol. 22; no. 24; p. 9936
Main Authors: Yousaf, Muhammad Zain, Tahir, Muhammad Faizan, Raza, Ali, Khan, Muhammad Ahmad, Badshah, Fazal
Format: Journal Article
Language:English
Published: Switzerland MDPI AG 16.12.2022
MDPI
Subjects:
Accuracy
Algorithms
Back propagation
Bayes Theorem
Bayesian optimization
Bias
Computer Simulation
Electricity distribution
Levenberg–Marquardt backpropagation
Localization
modular multilevel converter
Neural networks
Neural Networks, Computer
Power
protection sensor
Sensors
Signal processing
Time
Wavelet transforms
modular multilevel converter
Levenberg–Marquardt backpropagation
protection sensor
Bayesian optimization
ISSN:1424-8220, 1424-8220
Online Access:Get full text
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Summary:We develop a probabilistic model for determining the location of dc-link faults in MT-HVdc networks using discrete wavelet transforms (DWTs), Bayesian optimization, and multilayer artificial neural networks (ANNs) based on local information. Likewise, feedforward neural networks (FFNNs) are trained using the Levenberg–Marquardt backpropagation (LMBP) method, which multi-stage BO optimizes for efficiency. During training, the feature vectors at the sending terminal of the dc link are selected based on the norm values of the observed waveforms at various frequency bands. The multilayer ANN is trained using a comprehensive set of offline data that takes the denoising scheme into account. This choice not only helps to reduce the computational load but also provides better accuracy. An overall percentage error of 0.5144% is observed for the proposed algorithm when tested against fault resistances ranging from 10 to 485 Ω. The simulation results show that the proposed method can accurately estimate the fault site to a precision of 485 Ω and is more robust.
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ISSN:1424-8220
1424-8220
DOI:10.3390/s22249936