Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

Magnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be overlapped by additional forces acting on the tip such as electrostatic forces. In this work the possibility to reduce capacitive coupling effects betwee...

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Vydáno v:	Beilstein journal of nanotechnology Ročník 10; číslo 1; s. 1056 - 1064
Hlavní autoři:	Krivcov, Alexander, Ehrler, Jasmin, Fuhrmann, Marc, Junkers, Tanja, Möbius, Hildegard
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	Germany Beilstein-Institut zur Föerderung der Chemischen Wissenschaften 2019 Beilstein-Institut
Témata:	Bias capacitive coupling Coupling Dielectrics Dipoles electrostatic effects Film thickness Full Research Paper Iron oxides Magnetic fields Magnetic force microscopy Magnetic properties Magnetic signals Microscopy Nanoparticles Nanoscience Nanotechnology Substrates superparamagnetic iron oxide nanoparticle (SPION) Surface roughness Topography magnetic force microscopy capacitive coupling nanoparticles electrostatic effects superparamagnetic iron oxide nanoparticle (SPION)
ISSN:	2190-4286, 2190-4286
On-line přístup:	Získat plný text
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