Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

Magnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be overlapped by additional forces acting on the tip such as electrostatic forces. In this work the possibility to reduce capacitive coupling effects betwee...

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Veröffentlicht in:	Beilstein journal of nanotechnology Jg. 10; H. 1; S. 1056 - 1064
Hauptverfasser:	Krivcov, Alexander, Ehrler, Jasmin, Fuhrmann, Marc, Junkers, Tanja, Möbius, Hildegard
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	Germany Beilstein-Institut zur Föerderung der Chemischen Wissenschaften 2019 Beilstein-Institut
Schlagworte:	Bias capacitive coupling Coupling Dielectrics Dipoles electrostatic effects Film thickness Full Research Paper Iron oxides Magnetic fields Magnetic force microscopy Magnetic properties Magnetic signals Microscopy Nanoparticles Nanoscience Nanotechnology Substrates superparamagnetic iron oxide nanoparticle (SPION) Surface roughness Topography magnetic force microscopy capacitive coupling nanoparticles electrostatic effects superparamagnetic iron oxide nanoparticle (SPION)
ISSN:	2190-4286, 2190-4286
Online-Zugang:	Volltext
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