A simple and accurate method for calibrating the oscillation amplitude of tuning-fork based AFM sensors

We have developed a simple and accurate method for calibrating the amplitude of vibration of quartz tuning fork sensors commonly used in atomic force- and near field optical-microscopy. Unlike interferometric methods, which require a complex optical setup, the method we present requires only a simpl...

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Bibliographic Details
Published in:Ultramicroscopy Vol. 109; no. 1; pp. 81 - 84
Main Authors: Liu, Jinquan, Callegari, Andrea, Stark, Martin, Chergui, Majed
Format: Journal Article
Language:English
Published: Netherlands Elsevier B.V 01.12.2008
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ISSN:0304-3991, 1879-2723
Online Access:Get full text
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Summary:We have developed a simple and accurate method for calibrating the amplitude of vibration of quartz tuning fork sensors commonly used in atomic force- and near field optical-microscopy. Unlike interferometric methods, which require a complex optical setup, the method we present requires only a simple measurement of the electro-mechanical properties of the tuning-fork oscillator and can be performed in a matter of minutes without disturbing the experimental setup. Comparison with interferometric methods shows that an accuracy of better than few percent can be routinely achieved.
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ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2008.08.009