A simple and accurate method for calibrating the oscillation amplitude of tuning-fork based AFM sensors

We have developed a simple and accurate method for calibrating the amplitude of vibration of quartz tuning fork sensors commonly used in atomic force- and near field optical-microscopy. Unlike interferometric methods, which require a complex optical setup, the method we present requires only a simpl...

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Vydáno v:Ultramicroscopy Ročník 109; číslo 1; s. 81 - 84
Hlavní autoři: Liu, Jinquan, Callegari, Andrea, Stark, Martin, Chergui, Majed
Médium: Journal Article
Jazyk:angličtina
Vydáno: Netherlands Elsevier B.V 01.12.2008
Témata:
AFM
Interferometry
NSOM
SNOM
Tuning fork
AFM
NSOM
SNOM
Tuning fork
Interferometry
ISSN:0304-3991, 1879-2723
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Popis
Shrnutí:We have developed a simple and accurate method for calibrating the amplitude of vibration of quartz tuning fork sensors commonly used in atomic force- and near field optical-microscopy. Unlike interferometric methods, which require a complex optical setup, the method we present requires only a simple measurement of the electro-mechanical properties of the tuning-fork oscillator and can be performed in a matter of minutes without disturbing the experimental setup. Comparison with interferometric methods shows that an accuracy of better than few percent can be routinely achieved.
Bibliografie:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2008.08.009