A simple and accurate method for calibrating the oscillation amplitude of tuning-fork based AFM sensors
We have developed a simple and accurate method for calibrating the amplitude of vibration of quartz tuning fork sensors commonly used in atomic force- and near field optical-microscopy. Unlike interferometric methods, which require a complex optical setup, the method we present requires only a simpl...
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| Published in: | Ultramicroscopy Vol. 109; no. 1; pp. 81 - 84 |
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| Main Authors: | , , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
Netherlands
Elsevier B.V
01.12.2008
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| Subjects: | |
| ISSN: | 0304-3991, 1879-2723 |
| Online Access: | Get full text |
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| Summary: | We have developed a simple and accurate method for calibrating the amplitude of vibration of quartz tuning fork sensors commonly used in atomic force- and near field optical-microscopy. Unlike interferometric methods, which require a complex optical setup, the method we present requires only a simple measurement of the electro-mechanical properties of the tuning-fork oscillator and can be performed in a matter of minutes without disturbing the experimental setup. Comparison with interferometric methods shows that an accuracy of better than few percent can be routinely achieved. |
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| Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
| ISSN: | 0304-3991 1879-2723 |
| DOI: | 10.1016/j.ultramic.2008.08.009 |