Electrical properties of staggered electrode, solution-processed, polycrystalline tetrabenzoporphyrin field-effect transistors

We characterize and analyze the electrical performance of solution-processed, polycrystalline tetrabenzoporphyrin thin-film field-effect transistors with staggered source and drain contacts. Devices demonstrated a saturation field-effect mobility and threshold voltage on the order of 10/sup -2/ cm/s...

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Vydané v:IEEE Transactions on Electron Devices Ročník 52; číslo 7; s. 1497 - 1503
Hlavní autori: Shea, P.B., Johnson, A.R., Ono, N., Kanicki, J.
Médium: Journal Article
Jazyk:English
Vydavateľské údaje: New York, NY IEEE 01.07.2005
Institute of Electrical and Electronics Engineers (IEEE)
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN:0018-9383, 1557-9646
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Popis
Shrnutí:We characterize and analyze the electrical performance of solution-processed, polycrystalline tetrabenzoporphyrin thin-film field-effect transistors with staggered source and drain contacts. Devices demonstrated a saturation field-effect mobility and threshold voltage on the order of 10/sup -2/ cm/sup 2//V-s and -15 V, respectively, as well as a subthreshold slope of 1.2 V/decade and an ON-/OFF-current ratio exceeding 10/sup 5/. The device performance and electronic properties of the thin film were used to construct device energy band diagrams. Lastly, the device conduction mechanism is discussed.
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ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2005.850616