Luo, Y., Ding, X., Chen, T., Su, T., & Chen, D. (2023). Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe. Micromachines (Basel), 14(1), 227. https://doi.org/10.3390/mi14010227
Citace podle Chicago (17th ed.)Luo, Yongzhen, Xidong Ding, Tianci Chen, Tao Su, a Dihu Chen. "Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe." Micromachines (Basel) 14, no. 1 (2023): 227. https://doi.org/10.3390/mi14010227.
Citace podle MLA (9th ed.)Luo, Yongzhen, et al. "Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe." Micromachines (Basel), vol. 14, no. 1, 2023, p. 227, https://doi.org/10.3390/mi14010227.
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