Determining grain resolved stresses in polycrystalline materials using three-dimensional X-ray diffraction

An algorithm is presented for characterization of the grain resolved (type II) stress states in a polycrystalline sample based on monochromatic X‐ray diffraction data. The algorithm is a robust 12‐parameter‐per‐grain fit of the centre‐of‐mass grain positions, orientations and stress tensors includin...

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Vydané v:	Journal of applied crystallography Ročník 43; číslo 3; s. 539 - 549
Hlavní autori:	Oddershede, Jette, Schmidt, Søren, Poulsen, Henning Friis, Sørensen, Henning Osholm, Wright, Jonathan, Reimers, Walter
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.06.2010 Blackwell Publishing Ltd
Predmet:	Algorithms computer programs Crystallography Diffraction Errors Experiments Grains Orientation polycrystalline materials Shear Simulation Stresses three-dimensional X-ray diffraction X-ray diffraction X-rays
ISSN:	1600-5767, 0021-8898, 1600-5767
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