In situ ellipsometry studies on swelling of thin polymer films: A review

The properties of a thin polymer film can be significantly affected by the presence of a penetrant. This can have potential implications for many technological applications, such as protective and functional coatings, sensors, microelectronics, surface modification and membrane separations. In situ...

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Published in:Progress in polymer science Vol. 42; pp. 42 - 78
Main Authors: Ogieglo, Wojciech, Wormeester, Herbert, Eichhorn, Klaus-Jochen, Wessling, Matthias, Benes, Nieck E.
Format: Journal Article
Language:English
Published: Elsevier Ltd 01.03.2015
Subjects:
Automation
Brushes
Contact
Ellipsometry
In situ ellipsometry
Penetrants
Polymeric films
Protective
Swelling
Thin films
Thin polymer films
In situ ellipsometry
Swelling
Thin polymer films
ISSN:0079-6700, 1873-1619
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Abstract The properties of a thin polymer film can be significantly affected by the presence of a penetrant. This can have potential implications for many technological applications, such as protective and functional coatings, sensors, microelectronics, surface modification and membrane separations. In situ ellipsometry is a powerful technique for the characterization of a film in contact with a penetrant. The main advantages of ellipsometry include the very high precision and accuracy of this technique, combined with the fact that it is non-intrusive. Recent advances in the speed and automation of the technique have further expanded its application. This article provides an overview of the research that has been done with in situ UV–vis ellipsometry on penetrant-exposed polymeric films, in the last 15–20 years. The focus is predominantly on films that are not attached covalently to a substrate. Polymer brushes and grafts are therefore excluded. This review addresses a variety of topics, covering instrumental aspects of in situ studies, approaches to data analysis and optical models, reported precision and repeatability, the polymer-penetrant systems that have been studied, the kind of information that has been extracted, and other in situ techniques that have been combined with ellipsometry. Various examples are presented to illustrate different practical approaches, the consequences of the optical properties of the ambient, and the various ways that have been employed to bring polymer films in contact with a penetrant, ranging from simple ex situ-like configurations (i.e., drying studies) to complex high pressure cells. The versatility of in situ ellipsometry is demonstrated by examples of the distinctive phenomena studied, such as film dilation, penetrant diffusion mechanisms, film degradation, electrochemical processes, and the broad variety of polymer-penetrant systems studied (glassy and rubbery polymers, multilayer stacks, etc.). An outlook is given on possible future trends.
AbstractList The properties of a thin polymer film can be significantly affected by the presence of a penetrant. This can have potential implications for many technological applications, such as protective and functional coatings, sensors, microelectronics, surface modification and membrane separations. In situ ellipsometry is a powerful technique for the characterization of a film in contact with a penetrant. The main advantages of ellipsometry include the very high precision and accuracy of this technique, combined with the fact that it is non-intrusive. Recent advances in the speed and automation of the technique have further expanded its application. This article provides an overview of the research that has been done with in situ UV-vis ellipsometry on penetrant-exposed polymeric films, in the last 15-20 years. The focus is predominantly on films that are not attached covalently to a substrate. Polymer brushes and grafts are therefore excluded. This review addresses a variety of topics, covering instrumental aspects of in situ studies, approaches to data analysis and optical models, reported precision and repeatability, the polymer-penetrant systems that have been studied, the kind of information that has been extracted, and other in situ techniques that have been combined with ellipsometry. Various examples are presented to illustrate different practical approaches, the consequences of the optical properties of the ambient, and the various ways that have been employed to bring polymer films in contact with a penetrant, ranging from simple ex situ-like configurations (i.e., drying studies) to complex high pressure cells. The versatility of in situ ellipsometry is demonstrated by examples of the distinctive phenomena studied, such as film dilation, penetrant diffusion mechanisms, film degradation, electrochemical processes, and the broad variety of polymer-penetrant systems studied (glassy and rubbery polymers, multilayer stacks, etc.). An outlook is given on possible future trends.
The properties of a thin polymer film can be significantly affected by the presence of a penetrant. This can have potential implications for many technological applications, such as protective and functional coatings, sensors, microelectronics, surface modification and membrane separations. In situ ellipsometry is a powerful technique for the characterization of a film in contact with a penetrant. The main advantages of ellipsometry include the very high precision and accuracy of this technique, combined with the fact that it is non-intrusive. Recent advances in the speed and automation of the technique have further expanded its application. This article provides an overview of the research that has been done with in situ UV–vis ellipsometry on penetrant-exposed polymeric films, in the last 15–20 years. The focus is predominantly on films that are not attached covalently to a substrate. Polymer brushes and grafts are therefore excluded. This review addresses a variety of topics, covering instrumental aspects of in situ studies, approaches to data analysis and optical models, reported precision and repeatability, the polymer-penetrant systems that have been studied, the kind of information that has been extracted, and other in situ techniques that have been combined with ellipsometry. Various examples are presented to illustrate different practical approaches, the consequences of the optical properties of the ambient, and the various ways that have been employed to bring polymer films in contact with a penetrant, ranging from simple ex situ-like configurations (i.e., drying studies) to complex high pressure cells. The versatility of in situ ellipsometry is demonstrated by examples of the distinctive phenomena studied, such as film dilation, penetrant diffusion mechanisms, film degradation, electrochemical processes, and the broad variety of polymer-penetrant systems studied (glassy and rubbery polymers, multilayer stacks, etc.). An outlook is given on possible future trends.
Author Benes, Nieck E.
Eichhorn, Klaus-Jochen
Wormeester, Herbert
Wessling, Matthias
Ogieglo, Wojciech
Author_xml – sequence: 1
  givenname: Wojciech
  surname: Ogieglo
  fullname: Ogieglo, Wojciech
  email: w.ogieglo@utwente.nl
  organization: Inorganic Membranes, MESA+ Institute for Nanotechnology, University of Twente, Drienerlolaan 5, P.O. Box 217, 7500 AE Enschede, The Netherlands1
– sequence: 2
  givenname: Herbert
  surname: Wormeester
  fullname: Wormeester, Herbert
  email: h.wormeester@utwente.nl
  organization: Physics of Interfaces and Nanomaterials, MESA+ Institute for Nanotechnology, University of Twente, Drienerlolaan 5, P.O. Box 217, 7500 AE Enschede, The Netherlands2
– sequence: 3
  givenname: Klaus-Jochen
  surname: Eichhorn
  fullname: Eichhorn, Klaus-Jochen
  email: kjeich@ipfdd.de
  organization: Leibniz Institute for Polymer Research, Hohe Str. 6, P.O. Box 120 411, D-01069 Dresden, Germany3
– sequence: 4
  givenname: Matthias
  surname: Wessling
  fullname: Wessling, Matthias
  email: matthias.wessling@avt.rwth-aachen.de
  organization: DWI – Leibniz-Institute for Interactive Materials, Forckenbeckstrasse 50, 52074 Aachen, Germany4
– sequence: 5
  givenname: Nieck E.
  surname: Benes
  fullname: Benes, Nieck E.
  email: N.E.Benes@utwente.nl
  organization: Inorganic Membranes, MESA+ Institute for Nanotechnology, University of Twente, Drienerlolaan 5, P.O. Box 217, 7500 AE Enschede, The Netherlands1
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Swelling
Thin polymer films
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Snippet The properties of a thin polymer film can be significantly affected by the presence of a penetrant. This can have potential implications for many technological...
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SubjectTerms Automation
Brushes
Contact
Ellipsometry
In situ ellipsometry
Penetrants
Polymeric films
Protective
Swelling
Thin films
Thin polymer films
Title In situ ellipsometry studies on swelling of thin polymer films: A review
URI https://dx.doi.org/10.1016/j.progpolymsci.2014.09.004
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Volume 42
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