Cost Efficient Flip-Flop Designs With Multiple-Node Upset-Tolerance and Algorithm-Based Verifications

This article presents radiation-hardened flip-flop (FF) designs capable of tolerating soft errors, e.g., single-node upsets (SNUs), double-node upsets (DNUs) and multiple-node upsets (MNUs). First, a 2-input FF and a 3-input FF are proposed as the baseline FFs that not only, respectively, tolerate S...

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Vydáno v:IEEE transactions on computer-aided design of integrated circuits and systems Ročník 44; číslo 1; s. 390 - 394
Hlavní autoři: Yan, Aibin, He, Yuting, Huang, Zhengfeng, Yan, Wenjie, Cui, Jie, Wang, Xiaolei, Ni, Tianming, Girard, Patrick, Wen, Xiaoqing
Médium: Journal Article
Jazyk:angličtina
Vydáno: New York IEEE 01.01.2025
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Témata:
Algorithms
C-element (CE)
Costs
Design automation
Engineering Sciences
flip-flop (FF)
Flip-flops
Integrated circuits
Latches
Layout
Micro and nanotechnologies
Microelectronics
multiple-node-upset
Nodes
Radiation hardening
radiation hardness
Soft errors
verification algorithm
Verification algorithm
Flip-Flop
C-element
Multiple-node-upset
Radiation hardness
ISSN:0278-0070, 1937-4151
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Shrnutí:This article presents radiation-hardened flip-flop (FF) designs capable of tolerating soft errors, e.g., single-node upsets (SNUs), double-node upsets (DNUs) and multiple-node upsets (MNUs). First, a 2-input FF and a 3-input FF are proposed as the baseline FFs that not only, respectively, tolerate SNUs and DNUs but also exhibit cost efficiency in terms of delay, power, and area. Through adding two stages of c-elements, a 4-input FF and a 5-input FF are proposed as the baseline FFs as well. Utilizing the structural characteristics of these FFs, an <inline-formula> <tex-math notation="LaTeX">N-1 </tex-math></inline-formula> input FF and an N input FF are proposed as the extended FFs capable of tolerating more node upsets. Moreover, a highly efficient algorithm for verifying MNU-tolerance of these FFs is proposed. Algorithm and HSPICE-tool-based verification results both demonstrate the MNU-tolerance for the proposed FFs with more inputs.
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ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.2024.3426271