Multiple-Instance Learning Algorithms for Computer-Aided Detection

Many computer-aided diagnosis (CAD) problems can be best modelled as a multiple-instance learning (MIL) problem with unbalanced data, i.e., the training data typically consists of a few positive bags, and a very large number of negative instances. Existing MIL algorithms are much too computationally...

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Veröffentlicht in:IEEE transactions on biomedical engineering Jg. 55; H. 3; S. 1015 - 1021
Hauptverfasser: Dundar, M. Murat, Fung, Glenn, Krishnapuram, Balaji, Rao, R. Bharat
Format: Journal Article
Sprache:Englisch
Veröffentlicht: United States IEEE 01.03.2008
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN:0018-9294, 1558-2531
Online-Zugang:Volltext
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