Test pattern optimization scheme based on Hybrid Ant Colony Optimization

The trend toward device miniaturization has made digital circuit testing both essential and increasingly complex. To achieve complete fault coverage, a large number of test patterns are applied, which leads to increased switching activity due to larger number of transitions between consecutive patte...

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Vydáno v:	Scientific reports Ročník 15; číslo 1; s. 34453 - 18
Hlavní autoři:	Asha Pon, S., Jeyalakshmi, V.
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	London Nature Publishing Group UK 02.10.2025 Nature Publishing Group Nature Portfolio
Témata:	639/166 639/166/987 Algorithms Artificial intelligence Circuits Data compression Feedback Genetic algorithms Humanities and Social Sciences Hybrid ant colony optimization KL divergence Literature reviews Methods multidisciplinary Neural networks Optimization algorithms Optimization techniques Power consumption Prim’s algorithm Science Science (multidisciplinary) Test data reduction Test pattern reordering Transition count reduction KL divergence Prim’s algorithm Hybrid ant colony optimization Transition count reduction Test data reduction Test pattern reordering
ISSN:	2045-2322, 2045-2322
On-line přístup:	Získat plný text
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