A Review of Strain Analysis Using Electron Backscatter Diffraction

Since the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials science and geology research laboratories around the world. The acceptance of the technique is primarily due to the capability of EBSD to aid...

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Bibliographic Details

Published in:	Microscopy and microanalysis Vol. 17; no. 3; pp. 316 - 329
Main Authors:	Wright, Stuart I., Nowell, Matthew M., Field, David P.
Format:	Journal Article
Language:	English
Published:	New York, USA Cambridge University Press 01.06.2011 Oxford University Press
Subjects:	Crystal lattices Materials science Metallurgy electron backscatter diffraction (EBSD) elastic strain orientation imaging microscopy (OIM) residual strain
ISSN:	1431-9276, 1435-8115, 1435-8115
Online Access:	Get full text
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